Shape and Charge
Repulsion Analysis
Micromeritics Analytical Services (MAS) has the most extensive portfolio of particle sizing capabilities in the industry
Particle Sizing via Dynamic Light Scattering (DLS)
Available instruments:
- Particulate Systems NanoPlus HD
Particle Sizing via Static Light Scattering
Available instruments:
- Micromeritics Saturn High Resolution DigiSizer
- Malvern Instruments, Mastersizer 2000
The X-Ray Sedimentation Technique
Available instruments:
Electrical Sensing Zone
Particle size range is 0.5um to 300um
This is an excellent approach as an orthogonal method to more established light scattering techniques and is not subject to the shape and optical properties of particles as with light obscuration techniques.
Available instruments:
Air Permeablity Particle Sizing
Available instruments:
- Micromeritics SAS Subsieve AutoSizer
Sieves Analysis
Available instruments:
- Tyler Ro-Tap RX-29

SEM-Scanning Electron Microscopy
Available instruments:
Particle Shape Measurement
Shape is particularly important as a qualifying parameter for confirmation of particle sizing analysis based on light scattering and obscuration methods as these techniques use the basis that all particles are spherically shaped, which is not the case.
Micromeritics Analytical Services uses optical microscopy, scanning electron microscopy, and dynamic image analysis to report particle shape parameters.
Dynamic Image Analysis is an automated technique which uses a high-resolution CCD camera to capture images of particles as they pass through a detection zone. Once this image has been captured we can apply different shape parameters to calculate a particle size distribution.
Available Instruments:
- Phenom Pro Desktop SEM
- Particular Systems Particle Insight Dynamic Image Analyzer
- Optical Microscope
Light Obscuration
This technique is specifically useful in USP methods <788> and <789> for detecting particulates in injectable solutions.
Available Instruments:
- Particle Sizing Systems Accusizer Model 770
Zeta Potential-Charge Repulsion Measurement
Available instruments:
- Particulate Systems NanoPlus HD-3